Scientific Test 5000E 반도체 테스터 (2.0nA ~ 50A)

  • 생산업체: Scientific Test
    Model: 5000E
    보증: 12 month
    • 견적요구 견적요구
  • 연락처
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    핫라인: (+84) 969950220

    전화번호+84 (24) 62923267

Current Ranges:
- Standard: 2.0nA ~ 50A
- Up to 100A with Mainframe Extension
Voltage Ranges:
- Standard (anode): 10mV ~ 1000V
- 2000V with 2kV Anode Option
- Standard (gate): 10mv ~ 20V
- 80V with 80V Gate Option
Leakage:
- Max resolution: 1 NA (1PA)
- Accuracy: 1% + 2NA + 20PA/V
(1% + 200PA + 2PA/V)
Breakdown:
- Max resolution: 1V
- Accuracy:
BVCEO, BVCES, BVDSS, VD, BVCBO, VDRM, VRRM, VBB: 1% + 100MV
BVR, BVZ: 0.4% + 2 LSB
BVEBO, BVGSS, BVGKO: 1% + 10MV
Vcesus:
- Max resolution: 0.5V
- Accuracy: 2% + 0.5V
Impedance:
- Max resolution: 0.001 Ω 1μV
- Accuracy: 1% + 1% Range
Features
- Easy to Use
- PC Based
- Windows® Application Software Included
- Direct Test Data Capture into Excel
- High Speed ADC Single Test Measurement
- Fast Data Capture
- Capable of Testing Multiple and Mixed Devices
- Built-In Complete Self Test
- Hi Rel Delta On The Fly and Retest capabilities
- 1 kHz Zener Impedance
- Built-In Auto-Calibration
- RDSON to 0.1mOhm Resolution
- Autopolarity (diodes)
- Programmable Relay Drivers
- 99 Programmable Test Steps
- 96 Sorts
- Sort Qualify on Pass or Fail
- Branch on Non-Qualifying Test
- Relays tested
- Thermal delta VBE
- Dual VBE Matching
- Handler Interface
- Program Maximum Current/Voltage Limits to Prevent Damage or Heating
- Store/Recall Test Programs
- Multiple Devices
- Current Limit in Test Program
- Full Range of Current (not limited to 20A)
- No Patch Cords
- OVP and GATED OVP devices tested
- Parameter substitution With Math Expression Including References to Previous Tests
Semiconductor Devices Tested: From picoamps to 1200 amperes and from millivolts to 2000 volts

Details

Datasheet


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